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Image-Based Fault Detection at Scale for a Leading OEM

Virtual metrology &

predicting quality the LQC station (LQC = Lithography Quality Control)

This case study showcases how using Vanti’s service, a leading manufacturer of memory wafers shortens cycle time of a complex fabrication process characterized by naturally occurring data drifts.

Background

A top manufacturer for memory products is producing over half a million memory wafers yearly.

Challenge

Challenge

Solution process

Solution process

Results

Using Vanti’s service the OEM is now able to drastically minimize the previous dependency on physical quality sampling during metrology inspections, thereby reducing cycle time. Moreover, employing Vanti’s proprietary drift recovery mechanisms and auto-optimization of deployed models ensure a high quality of service at all times.

Results

Using Vanti’s service the OEM is now able to drastically minimize the previous dependency on physical quality sampling during metrology inspections, thereby reducing cycle time. Moreover, employing Vanti’s proprietary drift recovery mechanisms and auto-optimization of deployed models ensure a high quality of service at all times.
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