Virtual metrology and Data Drift Recovery for a Leading Memory Products OEM

Anomaly Detection

Background

A top manufacturer for memory products is producing over half a million memory wafers yearly. This use case highlights a single processing step and its following quality test, for simplicity.

Challenges

Solution process

Results

Using Vanti’s service the OEM is now able to drastically minimize the previous
dependency on physical quality sampling during metrology inspections, thereby
reducing cycle time. Moreover, employing Vanti’s proprietary drift recovery mechanisms
and auto-optimization of deployed models ensure a high quality of service at all times.