Virtual metrology and Data Drift Recovery for a Leading Memory Products OEM

Use Case post
plus
Anomaly Detection

Background

A top manufacturer for memory products is producing over half a million memory wafers yearly. This use case highlights a single processing step and its following quality test, for simplicity.

Use Case post

Challenges

Solution process

Virtual metrology and Data Drift Recovery for a Leading Memory Products OEM
Use Case post
use case

Results

Using Vanti’s service the OEM is now able to drastically minimize the previous
dependency on physical quality sampling during metrology inspections, thereby
reducing cycle time. Moreover, employing Vanti’s proprietary drift recovery mechanisms
and auto-optimization of deployed models ensure a high quality of service at all times.